JPH0161676U - - Google Patents
Info
- Publication number
- JPH0161676U JPH0161676U JP15675987U JP15675987U JPH0161676U JP H0161676 U JPH0161676 U JP H0161676U JP 15675987 U JP15675987 U JP 15675987U JP 15675987 U JP15675987 U JP 15675987U JP H0161676 U JPH0161676 U JP H0161676U
- Authority
- JP
- Japan
- Prior art keywords
- holding member
- circuit board
- guide column
- fixed plate
- pin board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000006835 compression Effects 0.000 claims description 4
- 238000007906 compression Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 4
- 230000001105 regulatory effect Effects 0.000 claims 3
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15675987U JPH0624783Y2 (ja) | 1987-10-15 | 1987-10-15 | 回路基板検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15675987U JPH0624783Y2 (ja) | 1987-10-15 | 1987-10-15 | 回路基板検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0161676U true JPH0161676U (en]) | 1989-04-19 |
| JPH0624783Y2 JPH0624783Y2 (ja) | 1994-06-29 |
Family
ID=31435587
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15675987U Expired - Lifetime JPH0624783Y2 (ja) | 1987-10-15 | 1987-10-15 | 回路基板検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0624783Y2 (en]) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006051643A1 (ja) * | 2004-11-15 | 2006-05-18 | Mitsubishi Denki Kabushiki Kaisha | 基板検査装置 |
| CN110940540A (zh) * | 2019-12-25 | 2020-03-31 | 厦门弘信电子科技股份有限公司 | 测试标记一体治具 |
-
1987
- 1987-10-15 JP JP15675987U patent/JPH0624783Y2/ja not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2006051643A1 (ja) * | 2004-11-15 | 2006-05-18 | Mitsubishi Denki Kabushiki Kaisha | 基板検査装置 |
| JP2006138808A (ja) * | 2004-11-15 | 2006-06-01 | Mitsubishi Electric Corp | 基板検査装置 |
| CN110940540A (zh) * | 2019-12-25 | 2020-03-31 | 厦门弘信电子科技股份有限公司 | 测试标记一体治具 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0624783Y2 (ja) | 1994-06-29 |